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Results 1 to 25 of 90

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Transmission electron microscopy studies of GaAs/Ge interfacesKISHORE, R; SOOD, K. N; SINGH, Sukhvir et al.SPIE proceedings series. 2002, pp 1111-1114, isbn 0-8194-4500-2, 2VolConference Paper

The effect of lattice matching between Buffer layer and YBa2Cu3O7-δ thin film on in-plane alignment of c-axis oriented thin filmsCHIBA, K; MAKINO, S; MUKAIDA, M et al.IEEE transactions on applied superconductivity. 2001, Vol 11, Num 1, pp 2734-2737, issn 1051-8223, 3Conference Paper

Interfacial stability between zirconium oxide thin films and siliconNINGLIN ZHANG; ZHITANG SONG; SU XING et al.Microelectronic engineering. 2003, Vol 66, Num 1-4, pp 427-432, issn 0167-9317, 6 p.Conference Paper

Si/Cu interface structure and adhesionWANG, Xiao-Gang; SMITH, John R.Physical review letters. 2005, Vol 95, Num 15, pp 156102.1-156102.4, issn 0031-9007Article

Roughness of equipotential lines due to a self-affine boundaryDE ASSIS, Tliiago A; MOTA, Fernando De B; MIRANDA, José G. V et al.Journal of physics. Condensed matter (Print). 2006, Vol 18, Num 13, pp 3393-3399, issn 0953-8984, 7 p.Article

Interfacial microstructure of anodic-bonded Al/glassXING QINGFENG; SASAKI, G; FUKUNAGA, H et al.Journal of materials science. Materials in electronics. 2002, Vol 13, Num 2, pp 83-88, issn 0957-4522Article

Comment on: Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction. Authors' replyBONGIORNO, Angelo; PASQUARELLO, Alfredo; DREINER, S et al.Physical review letters. 2005, Vol 94, Num 18, pp 189601.1-189602.1, issn 0031-9007Article

Model-independent one-dimensional imaging of interfacial structures at <1 Å resolutionFENTER, P; ZHANG, Z.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 8, pp 081401.1-081401.4, issn 1098-0121Article

Characterization and interpretation of interfacial structure of the Mg2Sn laths in an Mg-Sn-Mn-Ag-Zn alloyHUANG, X.-F; ZHANG, W.-Z.Philosophical magazine letters. 2014, Vol 94, Num 4-6, pp 251-259, issn 0950-0839, 9 p.Article

Interfaces in La1.89Ce0.11CuO4/Ba0.5Sr0.5TiO3/La0.88Sr0.12MnO3 heterostructures on (001) SrTiO3 substratesWANG, Y. M; GE, B. H; XIA, F. J et al.Philosophical magazine letters. 2014, Vol 94, Num 4-6, pp 205-210, issn 0950-0839, 6 p.Article

Molecular simulation of interfacial mechanics for solvent exfoliation of graphene from graphiteCUILI FU; XIAONING YANG.Carbon (New York, NY). 2013, Vol 55, pp 350-360, issn 0008-6223, 11 p.Article

Interface relaxation and electronic corrugation in the Pb/Si(111)-Pb-α- √3× √3HUPALO, M; YEH, V; CHAN, T. L et al.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 19, pp 193409.1-193409.4, issn 1098-0121Article

Evaluation of interfaces in narrow InAs/AlSb quantum wellsTANG, J; LARRABEE, D. C; KOLOKOLOV, K. I et al.IEEE Lester Eastman conference on high performance devices. 2002, pp 223-227, isbn 0-7803-7478-9, 5 p.Conference Paper

Morphological instability in InAs/GaSb superlattices due to interfacial bondsLI, J. H; STOKES, D. W; CAHA, O et al.Physical review letters. 2005, Vol 95, Num 9, pp 096104.1-096104.4, issn 0031-9007Article

Interface roughening in wrinkly metalAURONGZEB, Deeder.Journal of physics. Condensed matter (Print). 2005, Vol 17, Num 17, pp 2655-2662, issn 0953-8984, 8 p.Article

Controlling surface statistical properties using bias voltage : Atomic force microscopy and stochastic analysisSANGPOUR, P; JAFARI, G. R; AKHAVAN, O et al.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 15, pp 155423.1-155423.9, issn 1098-0121Article

Roughness conformity during tungsten film growth : An in situ synchrotron x-ray scattering studyPEVERINI, Luca; ZIEGLER, Eric; BIGAULT, Thierry et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 4, pp 045445.1-045445.6, issn 1098-0121Article

Oxygen polarity and interfacial atomic arrangement in an MgxZn1―xO/C-MgO/sapphire heterostructureXIANG HE; LIN GU; SANDONG GUO et al.Journal of physics. D, Applied physics (Print). 2013, Vol 46, Num 14, issn 0022-3727, 145303.1-145303.5Article

Unexpected exchange bias behaviour in CoFeB ultrathin films for MTJ sensors investigated by Lorentz microscopyBELLINI, E; McVITIE, S; MACLAREN, D. A et al.Journal of physics. D, Applied physics (Print). 2013, Vol 46, Num 30, issn 0022-3727, 305001.1-305001.10Article

Faceting of a rough solid―liquid interface of a metal induced by forced convectionBINDER, Sven; GALENKO, Peter K; HERLACH, Dieter M et al.Philosophical magazine letters. 2013, Vol 93, Num 10-12, pp 608-617, issn 0950-0839, 10 p.Article

The role of protein hydrophobicity in thionin―phospholipid interactions: a comparison of α1 and α2-purothionin adsorbed anionic phospholipid monolayersCLIFTON, Luke A; SANDERS, Michael; KINANE, Christian et al.PCCP. Physical chemistry chemical physics (Print). 2012, Vol 14, Num 39, pp 13569-13579, issn 1463-9076, 11 p.Article

Silicon-germanium interdiffusion and interfaces in self-assembled quantum dotsVANFLEET, R. R; BASILE, D. P; KAMINS, T. I et al.Applied physics. A, Materials science & processing (Print). 2007, Vol 86, Num 1, pp 1-9, issn 0947-8396, 9 p.Article

Frozen capillary waves on glass surfaces : an AFM studySARLAT, T; LELARGE, A; SØNDERGARD, E et al.The European physical journal. B, Condensed matter physics. 2006, Vol 54, Num 1, pp 121-126, issn 1434-6028, 6 p.Article

Observation of surface roughness at the interface by neutron reflectometryINOUE, Kazuko; HIRAYAMA, Tomoko; EBISAWA, Toru et al.Physica. B, Condensed matter. 2006, Vol 385-86, pp 659-662, issn 0921-4526, 4 p., 1Conference Paper

Roping in 6111 aluminum alloys with various iron contentsJIN, H; LLOYD, D. J.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 403, Num 1-2, pp 112-119, issn 0921-5093, 8 p.Article

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